Evaluation of memory cell characteristics

Details Evaluation of memory cell characteristics Evaluation of memory cell characteristics

1999-05-04

2000-02-29

Nguyen, Viet Q.

Static information storage and retrieval

Floating gate

Particular biasing

36518501, 36518518, 36518514, 36518521, G11C 1606, G11C 702

Patent

active

060317639

ABSTRACT:
Techniques are used to evaluate margin of programmable memory cells. In particular, techniques are used to measure negative erased threshold voltage levels. Techniques are used to increase the longevity and reliability of memory cells by adjusting a window of memory cell operation.

REFERENCES:
patent: 4132904 (1979-01-01), Harari
patent: 4546454 (1985-10-01), Gupta et al.
patent: 4596938 (1986-06-01), Cartwright, Jr.
patent: 4609986 (1986-09-01), Hartmann et al.
patent: 4617479 (1986-10-01), Hartmann et al.
patent: 4628487 (1986-12-01), Smayling
patent: 4652773 (1987-03-01), Cartwright, Jr.
patent: 4677318 (1987-06-01), Veenstra et al.
patent: 4713792 (1987-12-01), Hartmann et al.
patent: 4788460 (1988-11-01), Kobatake
patent: 4829203 (1989-05-01), Ashmore, Jr.
patent: 4871930 (1989-10-01), Wong et al.
patent: 4885719 (1989-12-01), Brahmbhatt
patent: 4887242 (1989-12-01), Hashimoto
patent: 4888734 (1989-12-01), Lee et al.
patent: 4899067 (1990-02-01), So et al.
patent: 4912342 (1990-03-01), Wong et al.
patent: 4924119 (1990-05-01), Lee
patent: 4935648 (1990-06-01), Radjy et al.
patent: 4979146 (1990-12-01), Yokoyama et al.
patent: 5005155 (1991-04-01), Radjy et al.
patent: 5016217 (1991-05-01), Brahmbhatt
patent: 5021693 (1991-06-01), Shima
patent: 5028810 (1991-07-01), Castro et al.
patent: 5043941 (1991-08-01), Sakamoto
patent: 5097449 (1992-03-01), Cuevas
patent: 5121006 (1992-06-01), Pedersen et al.
patent: 5157626 (1992-10-01), Watanabe
patent: 5214605 (1993-05-01), Lim et al.
patent: 5241224 (1993-08-01), Pedersen et al.
patent: 5247478 (1993-09-01), Gupta et al.
patent: 5260610 (1993-11-01), Pedersen et al.
patent: 5260611 (1993-11-01), Cliff et al.
patent: 5313427 (1994-05-01), Schreck et al.
patent: 5331599 (1994-07-01), Yero
patent: 5350954 (1994-09-01), Patel
patent: 5353248 (1994-10-01), Gupta
patent: 5386388 (1995-01-01), Atwood
patent: 5396468 (1995-03-01), Harari et al.
patent: 5434815 (1995-07-01), Smarandoiu et al.
patent: 5457653 (1995-10-01), Lipp
patent: 5572054 (1996-11-01), Wang et al.
patent: 5579274 (1996-11-01), Van Burkirk et al.
patent: 5587947 (1996-12-01), Chang et al.
patent: 5600594 (1997-02-01), Padoan et al.
patent: 5659550 (1997-08-01), Mehotra et al.
patent: 5748534 (1998-05-01), Dunlap et al.
patent: 5886926 (1999-03-01), Marquist
patent: B14617479 (1993-09-01), Hartmann et al.

Affiliated with

Also associated with

Rating

Evaluation of memory cell characteristics does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Evaluation of memory cell characteristics, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Evaluation of memory cell characteristics will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-688884