Ethylene glycol etch for processes using metal silicides

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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134 3, 156653, 156655, 252 793, 252 794, B44C 122, C03C 1500, C03C 2506, C23F 100

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045697221

ABSTRACT:
A novel etchant which comprises a mixture of ethylene glycol and hydrofluoric acid, preferably buffered hydrofluoric acid, has been found to control the etch rate of refractory metal silicides, in particular titanium silicide, in a manner such that titanium silicide may be used in place of tantalum silicide for interconnects and gates in semiconductor integrated circuits.

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patent: 4364793 (1982-12-01), Graves
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"Composite TiSi.sub.2
+ Poly-Si . . . ", IEEE Trans. on Elec. Devices, vol. ED-29, No. 4, 4/82, K. Wang et al., pp. 547-553.
"Formation and Properties of TiSi.sub.2 . . . ", Thin Solid Films, vol. 100, 1983, A. Guldan et al., pp. 1-7.
"Refractory Metal Silicides:Thin-Film . . . ", IEEE Trans. on Elec. Devices, vol. ED-30, No. 11, 11/83, T. Chow et al., pp. 1480-1497.
"Reactive Ion Etching for Submicron . . . ", J. Vac. Sci. Tech. B, vol. 1, No. 4, 10-12/83, M. Zhang et al., pp. 1037-1042.
"Ion Beam Etching of Silicon . . . ", J. Electrochem. Soc., vol. 131, No. 2, J. Chinn et al., pp. 375-380.

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