Etching with electrostatically attracted ions

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step

Reexamination Certificate

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C438S706000, C438S719000

Reexamination Certificate

active

10895733

ABSTRACT:
A technique comprises directing a plasma having at least first and second gasses at a substrate. The substrate is at least partially covered with at least the first and second layers. Ions of the first gas are electrostatically attracted towards the substrate. The second gas selectively etches the first layer relative to the second layer.

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patent: WO 02/062202 (2002-08-01), None

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