Etching method for metal layer of display panel

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S151000, C438S158000, C438S745000, C438S754000

Reexamination Certificate

active

11690137

ABSTRACT:
An etching process of a metal layer of a display panel is provided. First, a substrate with at least one display panel region, a testing device region, and a non-device region is provided. Then, a metal layer is formed over the substrate to cover the display panel region, the testing device region, and the non-device region. Next, a mask is formed on the metal layer to expose a portion of the metal layer. The area of the metal layer exposed by the mask substantially occupies 70%˜88% of the total area of the metal layer. Thereafter, a wet etching process is performed to remove the metal layer exposed by the mask.

REFERENCES:
patent: 5668650 (1997-09-01), Mori et al.
patent: 6218821 (2001-04-01), Bisbee
patent: 6297161 (2001-10-01), Sah
patent: 6762802 (2004-07-01), Ono et al.
patent: 2004/0004220 (2004-01-01), Suzuki
patent: 2005/0170564 (2005-08-01), Lai
patent: 2006/0099747 (2006-05-01), Park
patent: 584914 (2004-04-01), None
patent: 586223 (2004-05-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Etching method for metal layer of display panel does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Etching method for metal layer of display panel, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Etching method for metal layer of display panel will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3945263

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.