Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Patent
1985-07-23
1987-08-11
Kittle, J. E.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
430314, 430317, 430323, 430326, 430327, 430329, G03C 500
Patent
active
046861734
ABSTRACT:
An etching method is disclosed including a process of improving the adhesiveness between a positive resist layer and a material layer to be etched. The material layer to be etched is dipped in an organic solvent. The structural body thus-produced in the aforesaid process is placed in the atmosphere of Freon vapor to dry the material layer to be etched. The positive resist film is then formed on the surface of the material layer to be etched.
REFERENCES:
patent: 3942982 (1976-03-01), Yanazawa et al.
Kirk-Othmer, Encyclopedia of Chemical Technology, 2nd Edition, 1966, vol. 9, pp. 739-743.
Thompson et al., Introduction to Microlithography, Am. Chemical Soc., Washington, DC 1983.
Kanamori Jun
Yokoyama Mamoru
Dees Jos,e G.
Kittle J. E.
OKI Electric Industry Co., Ltd.
LandOfFree
Etching method employing positive photoresist film does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Etching method employing positive photoresist film, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Etching method employing positive photoresist film will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-402688