Etching and cleaning methods and etching and cleaning...

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – For liquid etchant

Reexamination Certificate

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Details

C156S345550, C134S094100, C134S099100, C134S137000, C134S157000, C134S198000, C134S199000

Reexamination Certificate

active

06964724

ABSTRACT:
An etching/cleaning apparatus is provided, which makes it possible to effectively remove an unnecessary material or materials existing on a semiconductor wafer without damaging the device area with good controllability. The apparatus comprises (a) a rotating means for holding a semiconductor wafer and for rotating the wafer in a horizontal plane; the wafer having a device area and a surface peripheral area on its surface; the surface peripheral area being located outside the device area; and (b) an edge nozzle for emitting an etching/cleaning liquid toward a surface peripheral area of the wafer. The etching/cleaning liquid emitted from the edge nozzle selectively removes an unnecessary material existing in the surface peripheral area. The etching/cleaning liquid emitted from the edge nozzle preferably has an emission direction oriented along a rotation direction of the wafer or outward with respect to a tangent of the wafer formed near a contact point of the liquid with the surface peripheral area of the wafer. A back nozzle may be additionally provided to emit an etching/cleaning liquid toward a back center of the wafer. A surface nozzle may be additionally provided to emit a protecting liquid toward a surface center of the wafer, covering the device area to protect the same against the etching/cleaning liquid.

REFERENCES:
patent: 4668334 (1987-05-01), Doornveld
patent: 4788994 (1988-12-01), Shinbara
patent: 4976810 (1990-12-01), Masuda et al.
patent: 5322079 (1994-06-01), Fukutomi et al.
patent: 5520205 (1996-05-01), Guldi et al.
patent: 5601645 (1997-02-01), Nonomura et al.
patent: 5779816 (1998-07-01), Trinh
patent: 5861066 (1999-01-01), Moinpour et al.
patent: 5879576 (1999-03-01), Wada et al.
patent: 5989342 (1999-11-01), Ikeda et al.
patent: 5993547 (1999-11-01), Sato
patent: 6063232 (2000-05-01), Terasawa et al.
patent: 6155275 (2000-12-01), Shinbara
patent: 6167583 (2001-01-01), Miyashita et al.
patent: 6202658 (2001-03-01), Fishkin et al.
patent: 6255228 (2001-07-01), Rolfson
patent: 6260562 (2001-07-01), Morinishi et al.
patent: 6299697 (2001-10-01), Nishibe et al.
patent: 6494221 (2002-12-01), Sellmer et al.
patent: 6516815 (2003-02-01), Stevens et al.
patent: 6558478 (2003-05-01), Katakabe et al.
patent: 6683007 (2004-01-01), Yamasaki et al.
patent: 6786224 (2004-09-01), Wong
patent: 2001/0042555 (2001-11-01), Bergman et al.
patent: 2004/0123952 (2004-07-01), Hur et al.
patent: 2004/0231711 (2004-11-01), Park et al.
patent: 0 368 334 (1990-05-01), None
patent: 0 516 490 (1992-12-01), None
patent: 0 736 925 (1996-10-01), None
patent: 0 814 536 (1997-12-01), None
patent: 0 924 754 (1999-06-01), None
patent: 62-60225 (1987-03-01), None
patent: 62-264626 (1987-11-01), None
patent: 63-193529 (1988-08-01), None
patent: 01-259536 (1989-10-01), None
patent: 02-197126 (1990-08-01), None
patent: H2-309638 (1990-12-01), None
patent: 04-311034 (1992-11-01), None
patent: 04-340226 (1992-11-01), None
patent: 05-23530 (1993-03-01), None
patent: 05-226808 (1993-09-01), None
patent: 63-22665 (1994-11-01), None
patent: 08-78378 (1996-03-01), None
patent: 8-236435 (1996-09-01), None
patent: 08-323303 (1996-12-01), None
patent: 09-186519 (1997-07-01), None
patent: 09-232410 (1997-09-01), None
patent: 09-260331 (1997-10-01), None
patent: 09-275087 (1997-10-01), None
patent: 09-293715 (1997-11-01), None
patent: H10-79334 (1998-03-01), None
patent: 10-83948 (1998-03-01), None
patent: 10-92912 (1998-04-01), None
patent: 10-135312 (1998-05-01), None
patent: 10-223593 (1998-08-01), None
patent: 10-242114 (1998-09-01), None
patent: 11-102883 (1999-04-01), None
patent: 11-274042 (1999-10-01), None
patent: 2000-58428 (2000-02-01), None
patent: 2000-100707 (2000-04-01), None
patent: 2001-156039 (2001-06-01), None
patent: 290707 (1996-11-01), None
patent: 333165 (1998-05-01), None
patent: WO 99-22419 (1999-05-01), None
patent: WO 99/46064 (1999-09-01), None

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