Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step
Patent
1993-07-23
1995-02-07
Dang, Thi
Adhesive bonding and miscellaneous chemical manufacture
Delaminating processes adapted for specified product
Delaminating in preparation for post processing recycling step
156640, 156664, 156345, 134 15, 134 64R, 134122R, 134129, 134172, 134199, B05B 300, C23F 100
Patent
active
053873130
ABSTRACT:
An etching system for etching openings in a metal web including multiple etching station for etching a metal web from opposite sides, with each of the etching stations including a set of first bank of oscillatable nozzles located in a first chamber in the etching station, with the first bank of oscillatable nozzles having predetermined spacings from one another and operable for directing etchant at a first side of a metal web and a second bank of oscillatable nozzles located in a second chamber in the etching station, with the second bank of oscillatable nozzles having a predetermined spacing substantially identical to the first bank of oscillatable nozzles, with the second set of oscillatable nozzles laterally offset from the first set of nozzles, so they do not spray on directly opposite regions located on the metal web, with the banks of the nozzles in adjacent etching stations offset from each other with the oscillation axis of the nozzles at an angle off normal, so that etchant is sprayed in elliptical patterns on the metal web to more uniformly distribute etchant across the metal web, including a system to oscillate the nozzles in different waveforms in response to measurements of openings in the metal web to compensate for changing etching conditions or changes in the thickness of the metal web without having to change the etchant flow rate to the metal web or the etchant pressure in the nozzles. Thus, the system includes hydraulic cylinders to oscillate the nozzles in accordance with a waveform different from the original waveform in response to a measurement of the metal web and allows the system to compensate, if necessary, for changing etching conditions or changes in the thickness of the metal web.
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BMC Industries, Inc.
Dang Thi
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