Etching a substrate: processes – Adhesive or autogenous bonding of two or more...
Reexamination Certificate
2005-06-21
2005-06-21
Ahmed, Shamim (Department: 1765)
Etching a substrate: processes
Adhesive or autogenous bonding of two or more...
C216S002000, C216S020000, C216S083000
Reexamination Certificate
active
06908565
ABSTRACT:
Methods for thinning wafer-to-wafer vertical stacks in the fabrication of stacked microelectronic devices. The methods include etching away unsupported portions of a wafer to be thinned in the vertical stack. The removal of the unsupported portions substantially eliminates potential cracking and chipping of the wafer, which can occur during the thinning process when the unsupported portions exist.
REFERENCES:
patent: 5869386 (1999-02-01), Hamajima et al.
patent: 5918139 (1999-06-01), Mitani et al.
Kim Sarah E.
List R. Scott
Ahmed Shamim
Intel Corporation
Winkle Robert G.
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