Etch process selective to cobalt silicide for formation of integ

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438754, 438755, H01L 21465

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active

059337575

ABSTRACT:
An etch process selective to cobalt silicide is described for the selective removal of titanium and/or titanium nitride, unreacted cobalt, and cobalt reaction products other than cobalt silicide, remaining after the formation of cobalt silicide on an integrated circuit structure on a semiconductor substrate in preference to the removal of cobalt silicide. The first step comprises contacting the substrate with an aqueous mixture of ammonium hydroxide (NH.sub.4 OH) and hydrogen peroxide (H.sub.2 O.sub.2) to selectively remove any titanium and/or titanium nitride in preference to the removal of cobalt silicide. The second step comprises contacting the substrate with an aqueous mixture of phosphoric acid (H.sub.3 PO.sub.4), acetic acid (CH.sub.3 COOH), and nitric acid (HNO.sub.3) to selectively remove cobalt and cobalt reaction products (other than cobalt silicide) in preference to the removal of cobalt silicide. In a preferred embodiment, the substrate is contacted by the respective etchant systems by spraying the respective etchant mixtures onto the substrate rather than immersing the substrate into baths containing the respective etchant mixtures.

REFERENCES:
patent: 5047367 (1991-09-01), Wei et al.
patent: 5567651 (1996-10-01), Berti et al.
patent: 5736461 (1998-04-01), Berti et al.

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