Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-05-09
2006-05-09
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S013000
Reexamination Certificate
active
07043705
ABSTRACT:
Estimating current density parameters on signal leads of an integrated circuit using computer aided design (CAD) tools. The signal leads are modeled as an impedance network (e.g., containing resistors and capacitors) and the driver cells are modeled as triangle (current) signal. The parameters of the triangle signal (e.g. peaks, periodicity) may be determined based on the characterization data of corresponding driver cell. By measuring the signals transferred on the impedances, the current density parameters on signal leads may be estimated.
REFERENCES:
patent: 5629621 (1997-05-01), Goldfine et al.
patent: 5812434 (1998-09-01), Nagase et al.
patent: 6038383 (2000-03-01), Young et al.
patent: 6397171 (2002-05-01), Belk
patent: 6513001 (2003-01-01), Kapur et al.
patent: 6598208 (2003-07-01), Sasaki et al.
patent: 6742167 (2004-05-01), Grau
patent: 6766498 (2004-07-01), Sharma et al.
patent: 6775807 (2004-08-01), Lowther et al.
patent: 6826517 (2004-11-01), Okada
patent: 6857113 (2005-02-01), Gentry et al.
patent: 2004/0194043 (2004-09-01), Sundar et al.
Nagaraj et al., “A Practical Approach to Static Signal Electromigration Analysis,” 1998 ACM/DAC, pp. 572-577.
Donohoe et al., “Simple Edge Basis Functions for Open-Ended Bodies of Revolution,” 1995 IEEE, pp. 329-332.
Ting et al., “AC Electromigration Characterization and Modeling of Multilayered Interconnects,” 1993 IEEE/IRPS, pp. 311-316.
Karunanidhi Sugandhini
Somayaji Ananth G
Brady III W. James
Garbowski Leigh M.
Stewart Alan K.
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
LandOfFree
Estimating current density parameters on signal leads of an... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Estimating current density parameters on signal leads of an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Estimating current density parameters on signal leads of an... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3563540