ESD protection devices with SCR structures for semiconductor...

Details ESD protection devices with SCR structures for semiconductor... ESD protection devices with SCR structures for semiconductor...

2007-03-06

2007-03-06

Doan, Theresa T. (Department: 2814)

Active solid-state devices (e.g., transistors, solid-state diode

Field effect device

Having insulated electrode

C257S361000, C257S371000

Reexamination Certificate

active

11250508

ABSTRACT:
To control the uneven distribution of current density and reduce the area of an ESD protection circuit in an SCR-type ESD protection device. An N-type well11, and P-type wells12aand12bdisposed oppositely and adjacent to the N-type well11, with the N-type well11interposed between them, are formed on the surface of a semiconductor substrate. A high concentration N-type region15ais formed on the surface of the P-type well12a, a high concentration N-type region15bis formed on the surface of the P-type well12b, and each of them is grounded. Further, a high concentration P-type region14ais formed, oppositely to the high concentration N-type region15a, on the surface of the N-type well11, and a high concentration P-type region14bis formed, oppositely to the high concentration N-type region15b, on the surface of the N-type well11, and each of them is connected to an I/O pad. A high concentration N-type region13is formed on the N-type well11, being interposed between the high concentration P-type region14aand the high concentration P-type region14b, and connected to a trigger device. A surge loaded on the I/O pad is released to the ground terminal via the SCR structures on the both sides.

REFERENCES:
patent: 5270565 (1993-12-01), Lee et al.
patent: 5895940 (1999-04-01), Kim
patent: 6545321 (2003-04-01), Morishita
patent: 6621133 (2003-09-01), Chen et al.
patent: 2004/0136127 (2004-07-01), Kodama et al.
patent: 2003-203985 (2003-07-01), None

Affiliated with

Also associated with

Rating

ESD protection devices with SCR structures for semiconductor... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with ESD protection devices with SCR structures for semiconductor..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and ESD protection devices with SCR structures for semiconductor... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3795613