ESD/EOS protection structure for integrated circuit devices

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S383000, C257S384000, C257S385000, C257S758000, C257S774000

Reexamination Certificate

active

06844600

ABSTRACT:
Apparatus and methods forming electrostatic discharge and electrical overstress protection devices for integrated circuits wherein such devices include shared electrical contact between source regions and between drain regions for more efficient dissipation of an electrostatic discharge. The devices further include contact plugs and contact lands which render the fabrication of the devices less sensitive to alignment constraint in the formation of contacts for the device.

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