Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-10-11
2005-10-11
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06954912
ABSTRACT:
Error detection apparatus and methods for dynamic logic are provided. Circuit errors are detected by comparing true and complement signals to ensure they are in fact complementary signals. A pseudocomplement technique is used to implement an adder in which distinct logic cones generate the true and complement carry signals. Other embodiments comprising additional features, such as shared logic cone decomposition, are also provided.
REFERENCES:
patent: 6195788 (2001-02-01), Leaver et al.
patent: 6556962 (2003-04-01), Patra
patent: 2003/0042933 (2003-03-01), Hill et al.
Srivastava, Pranjal, et al.; “Issues in the Design of Domino Logic Circuits”; Proceedings of the 8thGreat Lakes Symposium on VLSI, Lafayette, Louisiana, U.S.A.; Feb. 19-21, 1998; pp. 108-112.
Wang, Zhongde, et al.; “Fast Address Using Enhanced Multiple-Output Domino Logic”; IEEE Journal of Solid-State Circuits, vol. 32, No. 2, Feb. 1997; pp. 206-214.
Dhablania Atul
Naini Ajay
Srivastava Pranjal
Dimyan Magid Y.
Fenwick & West LLP
Smith Matthew
LandOfFree
Error detection in dynamic logic circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Error detection in dynamic logic circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Error detection in dynamic logic circuits will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3440399