Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2005-01-28
2009-10-20
Abraham, Esaw T (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
C714S786000
Reexamination Certificate
active
07607071
ABSTRACT:
An embodiment of the present invention is a technique to perform error correction using a trial-and-error method. A syndrome generator provides a generation of a data syndrome of a data word modified according to a selection of at least one of error correcting parameters. The data word is associated with at least one transaction performed on a unit. A controller controls iterating the generation of the data syndrome.
REFERENCES:
patent: 4359772 (1982-11-01), Patel
patent: 4564944 (1986-01-01), Arnold et al.
patent: 5291498 (1994-03-01), Jackson et al.
patent: 5487077 (1996-01-01), Hassner et al.
patent: 5537421 (1996-07-01), Dujari et al.
patent: 5623506 (1997-04-01), Dell et al.
patent: 5712861 (1998-01-01), Inoue et al.
patent: 5812564 (1998-09-01), Bonke et al.
patent: 5844919 (1998-12-01), Glover et al.
patent: 5974583 (1999-10-01), Joo
patent: 6003144 (1999-12-01), Olarig et al.
patent: 6272659 (2001-08-01), Zook
patent: 6651214 (2003-11-01), Weng et al.
patent: 6675349 (2004-01-01), Chen
patent: 7266760 (2007-09-01), Bain
patent: 2002/0023246 (2002-02-01), Jin
patent: 2004/0107397 (2004-06-01), Holman
Baum Allen J.
Neefs Henk Gomarus Caroline
Abraham Esaw T
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
LandOfFree
Error correction using iterating generation of data syndrome does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Error correction using iterating generation of data syndrome, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Error correction using iterating generation of data syndrome will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4101957