Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2006-04-25
2006-04-25
Chung, Phung My (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
C714S752000, C714S746000
Reexamination Certificate
active
07036068
ABSTRACT:
A magnetoresistive solid-state storage device (MRAM) employs error correction coding (ECC) to form ECC encoded stored data. In a read operation, parametric values are obtained from storage cells16of the device and compared to ranges to establish logical bit values, together with erasure information. The erasure information identifies symbols206in a block of ECC encoded data204which, from the parametric evaluation, are suspected to be affected by physical failures of the storage cells16. Where the position of suspected failed symbols206is known from this erasure information, the ability of a decoder22to perform ECC decoding is substantially enhanced.
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Davis James Andrew
Jedwab Jonathan
McIntyre David H.
Paterson Kenneth Graham
Perner Frederick A
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