Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate
2002-02-13
2009-10-06
Baker, Stephen M (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
C714S773000
Reexamination Certificate
active
07600165
ABSTRACT:
Methods and systems for improving repairing efficiency in non-volatile memory. Repairing data may be read from an information array associated with the non-volatile memory. The repairing data is generally read to a volatile latch associated with the non-volatile memory. An error correction coding circuit (ECC) circuit can be enabled during reading of the repairing data for identifying and repairing defective columns or rows associated with the non-volatile memory, despite errors in the repairing data read out.
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Baker Stephen M
Taiwan Semiconductor Manufacturing Co. Ltd.
Thomas Kayden Horstemeyer & Risley
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