Equivalence checking of scan path flush operations

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000, C716S030000, C716S030000, C716S030000, C714S724000, C714S726000, C714S728000

Reexamination Certificate

active

10875476

ABSTRACT:
A method, apparatus, system, and signal-bearing medium that in an embodiment apply a latch behavior to a first and second netlist, where the latch behavior exhibits transparent behavior. Flush enabling conditions are applied to the first netlist and a second netlist. For each latch in a first scan chain in the first netlist, a corresponding latch in the second netlist is found. Cones of logic are then extracted from the latches under the constraints enabling the flush operation, and the cones of logic are compared for functional equivalence. If all the cones are functionally equivalent, then the flush reset states of the netlists are functionally equivalent. If at least one of the cones is not functionally equivalent, then the flush reset states of the two netlists are not equivalent.

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