Environment controllable scanning probe microscope

Details Environment controllable scanning probe microscope Environment controllable scanning probe microscope

1991-12-19

1993-04-06

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

25044111, H01J 3718

Patent

active

052006166

ABSTRACT:
An environment controllable scanning probe microscope (SPM), such as a scanning tunneling microscope (STM), atomic force microscope (AFM), etc., in which the gaseous environment of the sample during the observation is controllable. That is, the gas surrounding the sample can be replaced to a desired one and the pressure can be set to a desired value. The SPM is suited for observing biological samples because biological samples may deteriorate under a reduced pressure and the surface topography at such high magnification is vulnerable to contamination from the environment.

REFERENCES:
patent: 4362937 (1982-12-01), Nakajima
patent: 4618767 (1986-01-01), Smith et al.
patent: 4992660 (1991-02-01), Kobayashi
patent: 5029249 (1991-07-01), Ohtaka
patent: 5061850 (1991-10-01), Kelly et al.
Imaging of Biomolecules with the Scanning Tunneling Microscope: Problems and Prospects, M. Salmeron, et al.

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