Enhanced passgate structures for reducing leakage current

Electronic digital logic circuitry – Multifunctional or programmable – Array

Reexamination Certificate

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C326S038000, C326S047000

Reexamination Certificate

active

10910891

ABSTRACT:
Enhanced passgate structures for use in low-voltage systems are presented in which the operational speed of the passgate structures is maximized, while minimizing leakage current when the structure is turned “OFF.” In one arrangement, the VTof the pass-gate structures is increased relative to the VTof other transistors fabricated according to a particular process dimension. In addition, a passgate activation voltage is applied to the passgate structures such that the passgate activation voltage is higher in voltage than a nominal voltage being supplied to circuitry other than the passgate structures.

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