Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Metallic housing or support
Reexamination Certificate
2005-04-26
2005-04-26
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
Metallic housing or support
C438S129000
Reexamination Certificate
active
06884662
ABSTRACT:
A new method is provided for the interface between a stress relieve interface layer of polyimide and a thereover created layer of mold compound. The invention provides for creating a pattern in the stress relieve layer of polyimide before the layer of mold compound is formed over the stress relieve layer of polyimide.
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Chen Ken
Huang Chender
Huang Hank
Tsao Pei-Haw
Wang Jones
Fourson George
Taiwan Semiconductor Manufacturing Company
Thomas Kayden Horstemeyer & Risley
Toledo Fernando L.
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