Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-02-27
2007-02-27
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S060000, C702S064000, C702S065000
Reexamination Certificate
active
11029595
ABSTRACT:
Provided is an electrical test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters. The electrical test device comprises a conductor probe element, a power supply, a processor and a display device. The power supply is interconnected between an external power source and a probe element. The processor is connected to the probe element and is configured to provide an input signal to the electrical system and receive an output signal in response thereto. The output signal is representative of at least one of the parameters of the electrical system. The display device is configured to display reading the output signal which is representative of the parameter. The electrical device is configured to allow for selective powering of the electrical system upon energization of the probe element during measurement of the parameters.
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Hoff Marc S.
Power Probe, Inc
Stetina Brunda Garred & Brucker
Suarez Felix
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