Encasing arrangement for a semiconductor component

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Housing or package filled with solid or liquid electrically...

Reexamination Certificate

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C257S729000, C257S730000, C257S773000, C257S776000, C257S779000, C257S782000, C257S783000

Reexamination Certificate

active

10149892

ABSTRACT:
A semiconductor component package configuration includes a semiconductor chip mounted to a printed circuit board, and a substrate arranged between the semiconductor chip and the printed circuit board. The substrate is for routing the wiring terminals of the semiconductor chip to the printed circuit board. The substrate is connected to the printed circuit board by solder joints. A filler between the semiconductor chip and the substrate mechanically isolates the semiconductor chip and the solder joints. A metal layer, which is connected to solder joints, is applied to the substrate. At least one molded element of heat-dissipating material is applied to the metal layer and is connected in a heat-conducting manner to the metal layer. This provides the package configuration with an improved capability of conducting the lost power that is dissipated from the installed semiconductor chip, and the desired mechanical properties of the package arrangement are retained.

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Author not listed: “Thermische Modellierung von Ball Grid Arrays”, [Thermal Simulation of Ball Grid Arrays], Elektronik, Aug. 1997, pp. 142-144.
Beine, H.: “Mikro-BGA: Durchbruch für die Chip-Scale-Packages”, [Micro-BGA: Breakthrough for the Chip-Scale-Packages], productronic, Nov., 1997, pp. 124-125.
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Eyman, L. et al.: “A Thermally Enhanced 2-Layer PBGA Substrate Design”, Motorola Inc., Jan. 1999.

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