Encapsulated MOS transistor gate structures and methods for...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S680000, C438S197000

Reexamination Certificate

active

07091119

ABSTRACT:
Transistor gate structures, encapsulation structures, and fabrication techniques are provided, in which sidewalls of patterned gate structures are conditioned by nitriding the sidewalls of the gate structure, and a silicon nitride encapsulation layer is formed to protect the conditioned sidewalls during manufacturing processing. The conditioning and encapsulation avoid oxidation of gate stack layers, particularly metal gate layers, and also facilitate repairing or restoring stoichiometry of metal and other gate layers that may be damaged or altered during gate patterning.

REFERENCES:
patent: 4628588 (1986-12-01), McDavid
patent: 4641417 (1987-02-01), McDavid
patent: 4672419 (1987-06-01), McDavid
patent: 4954867 (1990-09-01), Hosaka
patent: 5633522 (1997-05-01), Dorleans et al.
patent: 5723893 (1998-03-01), Yu et al.
patent: 5937315 (1999-08-01), Xiang et al.
patent: 6218276 (2001-04-01), Liu et al.
patent: 6265297 (2001-07-01), Powell
patent: 6274900 (2001-08-01), San et al.
patent: 6376342 (2002-04-01), Tseng
patent: 6383870 (2002-05-01), San et al.
patent: 6410967 (2002-06-01), Hause et al.
patent: 6432817 (2002-08-01), Bertrand et al.
patent: 6602781 (2003-08-01), Xiang et al.
patent: 6617624 (2003-09-01), Powell
patent: 2002/0192888 (2002-12-01), Ajmera et al.
“An Investigation of Molybdenum Gate for Submicrometer CMOS”, Robert F. Kwasnick, Edmund B. Kaminsky, Paul A. Frank, Gerhard A Franz, Kenneth J. Polasko, Richard J. Saia and Thomas B. Gorczya, IEEE Transactions on Electron Devices, vol. 35, No. 9, Sep. 1988, pp. 1432-1438.
“FinFET Process Refinements for Improved Mobility and Gate Work Function Engineering”, Yang-Kyu Choi, Leland Chang, Pushkar Ranade, Jeong-Soo Lee, Daewon Ha, Sriram Balasubramanian, Aditya Agarwal, Mike Ameen, Tsu-Jae King and Jeffrey Bokor, IEEE, 2002, 4 pgs.
“Silicon Processing for the VLSI Era, vol. 2: Process Integration”, Stanley Wold Ph.D., Copyright 1990, Lattice Press, 7 pgs.
“Electrical Characteristics of TiB2for ULSI Applications”, Chang Sik Choi, Qingfeng Want, Carlton M. Osburn, Gary A. Ruggles and Ayan S. Shah, IEEE Transactions on Electron Devices, vol. 39, No. 10, Oct. 1992, pp. 2341-2345.
“Mo2N/Mo GAFF MOSFETs”, Nanjin J. Kim and Dale M. Brown, IEEE, 1982, 4 pgs.
“Application of MoSi2to the Double-Level Interconnections of I2L Circuits”, Yoshitaka Sasaki, Osamu Ozaza and Shuichi Kameyama, IEEE Transactions on Electron Devices, vol. ED-27, No. 8, Aug. 1980, 5 pgs.
“Work Function Controlled Silicide Technology for Submicron CMOS”, Masakazu Kakumu and Kazuhiko Hashimoto, No Source or Date Available, pp. 30-31.
“Refractory Metal Silicide/N+ Polysilicon in CMOS/SOS”, B.C. Leung and J.S. Maa, No Source or Date Available, pp. 827-830.
“Fabrication of Mo-Gate/Ti-Silicide-Clad-Moat MOS Devices by Use of Multilayer-Glass Depositions”, J.M. McDavid, IEEE Electron Device Letters, vol. EDL-5, No. 9, Sep. 1984, pp. 374-375.
“Lightly Impurity Doped (LD) Mo Silicide Gate Technology”, Masakazu Kakumu and Jun'Ichi Matsunaga, IEEE, 1985, 4 pgs.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Encapsulated MOS transistor gate structures and methods for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Encapsulated MOS transistor gate structures and methods for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Encapsulated MOS transistor gate structures and methods for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3617217

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.