Embedded memory cell and method of manufacturing same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257SE27093, C257S303000, C438S243000

Reexamination Certificate

active

07999298

ABSTRACT:
An embedded memory cell includes a semiconducting substrate (110), a transistor (120) having a source/drain region (121) at least partially embedded in the semiconducting substrate, and a capacitor (130) at least partially embedded in the semiconducting substrate. The capacitor includes a first electrode (131) and a second electrode (132) that are electrically isolated from each other by a first electrically insulating material (133). The first electrode is electrically connected to the semiconducting substrate and the second electrode is electrically connected to the source/drain region of the transistor.

REFERENCES:
patent: 4301592 (1981-11-01), Lin
patent: 4803535 (1989-02-01), Taguchi
patent: 5804848 (1998-09-01), Mukai
patent: 5844278 (1998-12-01), Mizuno et al.
patent: 5899710 (1999-05-01), Mukai
patent: 6018176 (2000-01-01), Lim
patent: 6066869 (2000-05-01), Noble et al.
patent: 6413802 (2002-07-01), Hu et al.
patent: 6459123 (2002-10-01), Enders et al.
patent: 6472258 (2002-10-01), Adkisson et al.
patent: 6525403 (2003-02-01), Inaba et al.
patent: 6562665 (2003-05-01), Yu
patent: 6583469 (2003-06-01), Fried et al.
patent: 6611029 (2003-08-01), Ahmed et al.
patent: 6630388 (2003-10-01), Sekigawa et al.
patent: 6635909 (2003-10-01), Clark et al.
patent: 6642090 (2003-11-01), Fried et al.
patent: 6657259 (2003-12-01), Fried et al.
patent: 6689650 (2004-02-01), Gambino et al.
patent: 6770516 (2004-08-01), Wu et al.
patent: 6787402 (2004-09-01), Yu
patent: 6794718 (2004-09-01), Nowak et al.
patent: 6798000 (2004-09-01), Luyken et al.
patent: 6800910 (2004-10-01), Lin et al.
patent: 6803631 (2004-10-01), Dakshina-Murthy et al.
patent: 6812075 (2004-11-01), Fried et al.
patent: 6815277 (2004-11-01), Fried et al.
patent: 6821834 (2004-11-01), Ando
patent: 6833588 (2004-12-01), Yu et al.
patent: 6835614 (2004-12-01), Hanafi et al.
patent: 6849884 (2005-02-01), Clark et al.
patent: 6869868 (2005-03-01), Chiu et al.
patent: 6885055 (2005-04-01), Lee
patent: 6897527 (2005-05-01), Dakshina-Murthy et al.
patent: 2006/0205143 (2006-09-01), Govindarajan
patent: 2008/0237678 (2008-10-01), Datta et al.
patent: 10-2002-09418 (2002-02-01), None
patent: 10-2004-79523 (2004-09-01), None
patent: 10-2008-43143 (2008-06-01), None
patent: 10-2008-48244 (2008-06-01), None
patent: 2010/078051 (2010-07-01), None
Choi, Yang-Kyu et al., “Sub-20nm CMOS FinFET Technologies”, Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, IEEE 2001, 4 pgs.
Park, Jong-Tae et al., “Pi-Gate SOI MOSFET”, IEEE Electron Device Letters, vol. 22, No. 8, Aug. 2001, pp. 405-406.
International Search Report and Written Opinion for PCT Patent Publicaiton No. PCT/US2009/068524, mailed on Jul. 9, 2010, 8 pages.

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