Embedded insulating band for controlling short-channel...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S332000, C257S374000, C257S401000, C257S510000, C257S520000, C257S622000, C257S627000, C438S198000, C438S406000, C438S424000

Reexamination Certificate

active

07541629

ABSTRACT:
A method and structure for reducing leakage currents in integrated circuits based on a direct silicon bonding (DSB) fabrication process. After recessing a top semiconductor layer and an underlying semiconductor substrate, a dielectric layer may be deposited and etched back to form embedded spacers. Conventional source/drain regions may then be formed.

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Sung, Chun-Yung et al., “High Performance CMOS Bulk Technology Using Direct Silicon Bond (DSB) Mixed Crystal Orientation Substrates,” IEEE International Electron Device Meeting (IEDM), Dec. 2005, pp. 225-228, Vol. 5, No. 7.
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