Electrical computers and digital processing systems: memory – Storage accessing and control – Specific memory composition
Reexamination Certificate
2007-07-31
2007-07-31
Choi, Woo H. (Department: 2189)
Electrical computers and digital processing systems: memory
Storage accessing and control
Specific memory composition
C365S185010
Reexamination Certificate
active
10768743
ABSTRACT:
An application-specific embeddable flash memory having three content-specific I/O ports and delivering a peak read throughput of 1.2 GB/s. The memory is combined with a special automatic programming gate voltage ramp generator circuit having a programming rate of 1 Mbyte/s for non-volatile storage of code, data, and embedded FPGA bit stream configurations. The test chip uses a NOR-type 0.18 μm flash embedded technology with 1.8V power supply, two poly, six metal and memory cell size of 0.35 μm2.
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Borgatti Michele
Pasotti Marco
Rolandi Pier Luigi
Choi Woo H.
Jorgenson Lisa K.
Seed IP Law Group PLLC
STMicroelectronics S.r.l.
Tarleton E. Russell
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