Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2008-01-29
2008-01-29
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C257SE23010
Reexamination Certificate
active
11044282
ABSTRACT:
A method for making novel elevated bond-pad structures with sidewall spacers is achieved. The elevated bond-pad structures increase the space between the chip and a substrate during flip-chip bonding. The increased spacing results in better under-filling and reduces alpha particle soft errors in the chip. The sidewall spacers restrict the wetting surface for the PbSn solder bumps to the top surface of the bond pads. This results in smaller solder bumps and allows for closer spacings of the array of bonding pads for higher density integrated circuits.
REFERENCES:
patent: 5251806 (1993-10-01), Agarwala et al.
patent: 5523920 (1996-06-01), Machuga et al.
patent: 5891756 (1999-04-01), Erickson
patent: 6037213 (2000-03-01), Shih et al.
patent: 6124165 (2000-09-01), Lien
patent: 6376353 (2002-04-01), Zhou et al.
patent: 6544880 (2003-04-01), Akram
patent: 6578754 (2003-06-01), Tung
patent: 6692629 (2004-02-01), Chen et al.
patent: 6770547 (2004-08-01), Inoue et al.
patent: 2002/0121692 (2002-09-01), Lee et al.
patent: 2004/0157450 (2004-08-01), Bojkov et al.
patent: 2006/0057836 (2006-03-01), Nagarajan et al.
Lam Jeffrey
Lim Victor Seng-Keong
Zhang Fan
Chartered Semiconductor Manufacturing Ltd.
Lebentritt Michael
Stevenson Andre′
LandOfFree
Elevated bond-pad structure for high-density flip-clip... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Elevated bond-pad structure for high-density flip-clip..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Elevated bond-pad structure for high-density flip-clip... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3915361