Patent
1974-02-28
1978-03-21
Miller, Jr., Stanley D.
357 36, 357 51, 357 86, H01L 2990
Patent
active
040806162
ABSTRACT:
A protective element for preventing electrostatic puncture of a semiconductor integrated circuit comprises a semiconductor substrate of one conductivity type, a first semiconductor region of the opposite conductivity type formed within a selected part of the surface of the semiconductor substrate, and a second semiconductor region of the one conductivity type formed within a selected part of the surface of the first semiconductor region, the first and second semiconductor regions being partially short-circuited. When a surge pulse voltage is impressed between the substrate and the second region, the element operates as a diode or a transistor so as to absorb the surge pulse.
REFERENCES:
patent: 3210620 (1965-10-01), Lin
patent: 3590340 (1971-06-01), Kubo et al.
patent: 3629667 (1971-12-01), Lubart et al.
patent: 3712995 (1973-01-01), Steudel
patent: 3739238 (1973-06-01), Hara
patent: 3754171 (1973-08-01), Anzai et al.
patent: 3801886 (1974-04-01), Imaizumi et al.
Clawson Jr. Joseph E.
Hitachi , Ltd.
Miller, Jr. Stanley D.
LandOfFree
Electrostatic puncture preventing element does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electrostatic puncture preventing element, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrostatic puncture preventing element will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-572849