Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-04-04
2006-04-04
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C703S014000
Reexamination Certificate
active
07024646
ABSTRACT:
Systems and methods provide electrostatic discharge simulation techniques. For example, a method in accordance with an embodiment of the present invention provides a simulation of electrostatic discharge in integrated circuits. The method may allow for the design of protection circuits and simulating electrostatic discharge events concurrently with the design of the associated electrical circuit.
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Chong Nui
Logie Stewart
Omid-Zohoor Farrokh Kia
Lattice Semiconductor Corporation
Levin Naum
Michelson Greg J.
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