Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-10-31
2006-10-31
Jackson, Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S339000, C257S357000, C257S401000
Reexamination Certificate
active
07129546
ABSTRACT:
An ESD protection device. The ESD protection device has a substrate; a channel region, a source region, and a drain region. The channel region is formed on a predetermined area of a surface of the substrate, the channel region has a first side and a second side. The source region is formed adjacent to the first side. The drain region which has a heavily doped region and a lightly doped region formed below the heavily doped region is formed adjacent to the second side. The width along a longitudinal axis of the heavily doped region has variable length and thus the length between one side of the heavily doped region to the second side has variable length.
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Ker Ming-Dou
Lin Geeng-Lih
Lin Kun-Hsien
Jackson Jerome
Vanguard International Semiconductor Corporation
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