Electrostatic discharge device verification in an integrated...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C703S014000

Reexamination Certificate

active

07617467

ABSTRACT:
Processor-implemented techniques for verifying ESD device connectivity in an IC include the steps of: receiving an input dataset including layout parameters corresponding to the integrated circuit; identifying ESD devices based at least in part on the input dataset; extracting devices and parasitic elements in at least a portion of the integrated circuit based at least in part on the input dataset; generating a file including connectivity information and dimensional characteristics for extracted devices and parasitic elements associated with at least the identified ESD devices in the integrated circuit; identifying at least one ESD test based on the identified ESD devices and on connectivity to the identified ESD devices; and performing a linear network analysis for each identified ESD test based at least in part on the file.

REFERENCES:
patent: 6087841 (2000-07-01), Bonaccio et al.
patent: 6249410 (2001-06-01), Ker et al.
patent: 6553542 (2003-04-01), Ramaswamy et al.
patent: 6725439 (2004-04-01), Homsinger et al.
patent: 7065728 (2006-06-01), Bakir et al.
patent: 7114137 (2006-09-01), Hayashi
patent: 7164566 (2007-01-01), Xu et al.
patent: 7302378 (2007-11-01), Hayashi
patent: 7312517 (2007-12-01), Hirata
patent: 7350160 (2008-03-01), Perez et al.
patent: 7451414 (2008-11-01), Groos
patent: 2008/0134119 (2008-06-01), Chen et al.
patent: 2009/0019414 (2009-01-01), Eshun et al.
patent: 2008108091 (2008-05-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electrostatic discharge device verification in an integrated... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electrostatic discharge device verification in an integrated..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrostatic discharge device verification in an integrated... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4100665

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.