Electronic device using zirconate titanate and barium titanate f

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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365145, 365149, 361312, 361313, 361322, H01L 2994, H01G 420, H01G 406, G11C 1122

Patent

active

055720528

ABSTRACT:
In an electronic device using lead zirconate titanate (PZT) or lanthanum lead zirconate titanate (PLZT) as the main insulating material, a PZT film or a PLZT film is formed on a sub-insulating layer consisting essentially of lead titanate, lanthanum lead titanate, barium titanate, strontium titanate, barium strontium titanate, lead zirconate, or lanthanum lead zirconate. In an MIS structure, a semiconductor, the sub-insulating layer, the PZT film and metal are deposited in order. In a capacitor, the sub-insulating layer and the PZT film are sandwiched between a pair of electrodes. The sub-insulating layer improves crystallinity of PZT or PLZT, and the dielectric constant. An oxide of Pb, La, Zr or Ti can be added as the sub-insulating layer in order to further suppress current leakage.

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