Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2006-01-23
2008-08-19
Dinh, Son (Department: 2824)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S063000, C365S156000
Reexamination Certificate
active
07414877
ABSTRACT:
An electronic device can include a static-random-access memory cell. The static-random-access memory cell can include a first transistor of a first type and a second transistor of a second type. The first transistor can have a first channel length extending along a first line, and the second transistor can have a second channel length extending along a second line. The first line and the second line can intersect at an angle having a value other than any integer multiple of 22.5°. In a particular embodiment, the first transistor can include a pull-up transistor, and the second transistor can include a pass gate or pull-down transistor. A process can be used to form semiconductor fins and conductive members, which include gate electrode portions, to achieve the electronic device including the first and second transistors.
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Burnett James D.
Nguyen Bich-Yen
Winstead Brian A.
Dinh Son
Freescale Semiconductor Inc.
Nguyen Hien N
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