Electronic device and manufacturing method thereof

Details Electronic device and manufacturing method thereof Electronic device and manufacturing method thereof

2008-08-29

2010-02-02

Picardat, Kevin M (Department: 2822)

Semiconductor device manufacturing: process

With measuring or testing

Electrical characteristic sensed

C438S010000, C438S014000, C438S682000

Reexamination Certificate

active

07655483

ABSTRACT:
An electronic device includes an element group which generates a specific identification number and is composed of a plurality of elements. The specific identification number is set based on irregular deviation in electric characteristic of the elements which is caused due to a random failure in a manufacturing process.

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patent: WO 02/45139 (2002-06-01), None
Kedziersky, Jakub., et al. “Threshold voltage control in NiSi-gated MOSFETs through silicidation induced impurity segregation (SIIS).” International Electron Devices Meeting 2003m Technical Digest, pp. 1-4.

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