Electronic component with a shift register test architecture (bo

Details Electronic component with a shift register test architecture (bo Electronic component with a shift register test architecture (bo

1993-09-27

1995-10-10

Voeltz, Emanuel T.

Excavating

324 731, H04B 1700

Patent

active

054576997

ABSTRACT:
An electronic component with a shift register test architecture (boundary scan) includes test cells. A register cell in a test cell is programmable with a manufacturer datum.

REFERENCES:
patent: 5015875 (1991-05-01), Giles et al.
patent: 5150044 (1992-09-01), Hashizume et al.
patent: 5155732 (1992-10-01), Jarwala
patent: 5221865 (1993-06-01), Phillips et al.
patent: 5222068 (1993-06-01), Burchard
patent: 5254942 (1993-10-01), D'Souza et al.
patent: 5281864 (1994-01-01), Hahn et al.
patent: 5311520 (1994-05-01), Raghavachari
Publication: Elektronik Sep. 1928, .4. 1989, Maierhofer et al, "JTAG Boundary-Scan", pp. 108-113.
Research Disclosure, No. 308, Dec. 1989, New York, p. 954.
"Der JTAG Boundary-Scan", Elektronik, vol. 38, No. 9, Apr. 1989, Munchen, pp. 108-113.
IBM Technical Disclosure Bulletin, vol. 22, No. 12, May 1980, p. 5411.

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