Electronic component test apparatus with rotational probe and co

Details Electronic component test apparatus with rotational probe and co Electronic component test apparatus with rotational probe and co

1997-04-09

2000-04-18

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324761, G01R 3102

Patent

active

060519827

ABSTRACT:
A test apparatus including at least one probe member precisely aligned using two spaced apart means (e.g., thin layers) such that the probe can effectively engage a conductor (e.g., solder ball) on an electronic module (e.g., ball grid array package). A compressible member (e.g., elastomeric body) is used to bias the probe toward the conductor. Various probe cross-sectional configurations are also provided. As taught herein, the probe electrically contacts one of the spaced apart means, also conductive, to thus form a circuit which can extend externally of the apparatus (e.g., for connecting to appropriate testing equipment).

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IBM Technical Disclosure Bulletin vol. 25, No. 11B, Apr. 1983, .Spring-Loaded Probe With Rotational Wiping Feature., by Ferris et al.
IBM Technical Disclosure Bulletin vol. 37, No. 02B, Feb. 1994, .Tini-Probe Interposer Connector., by Byrnes et al.

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