Electronic component test apparatus with rotational probe

Details Electronic component test apparatus with rotational probe Electronic component test apparatus with rotational probe

1996-08-02

1998-09-08

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3102

Patent

active

058049843

ABSTRACT:
A test apparatus including at least one probe member precisely aligned using two spaced apart means (e.g., thin dielectric layers having copper thereon) such that the probe can effectively engage a conductor (e.g., solder ball) on an electronic module (e.g., ball grid array package). A compressible member (e.g., elastomeric body) is used to bias the probe toward the conductor. Various probe cross-sectional configurations are also provided.

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IBM Technical Disclosure Bulletin vol. 25, No. 11B, Apr. 1983, .Spring-Loaded Probe With Rotational Wiping Feature., by Ferris et al.
IBM Technical Disclosure Bulletin vol. 37, No. 02B, Feb. 1994, .Tini-Probe Interposer Connector., by Byrnes et al.

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