Electronic-circuit analysis program, method, and apparatus...

Details Electronic-circuit analysis program, method, and apparatus... Electronic-circuit analysis program, method, and apparatus...

2008-07-01

2008-07-01

Dinh, Paul (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C703S014000, C703S019000

Reexamination Certificate

active

11259273

ABSTRACT:
A design-change-target-circuit detecting unit inputs circuit information including an element model describing an electronic circuit to detect an electronic circuit using a changed element model. A determining unit compares a characteristic of an element model before change and that of the element model after change. An analysis-necessity deciding unit decides whether waveform analysis is necessary, and when determining that waveform analysis is necessary, makes an instruction for waveform analysis of the electronic circuit using the element model after change. Furthermore, after the determination-necessity deciding unit determines that waveform analysis of the electronic circuit using the element model after change is not necessary and design requirement conditions of the electronic circuit including the element model after change are changed from those before change, an instruction for pass/fail determination as to whether existing waveform analysis results satisfy the design requirement conditions after change is made to cause the instruction to be executed.

REFERENCES:
patent: 5508937 (1996-04-01), Abato et al.
patent: 5751593 (1998-05-01), Pullela et al.
patent: 6041170 (2000-03-01), Feldmann et al.
patent: 6209122 (2001-03-01), Jyu et al.
patent: 6230302 (2001-05-01), Gabele et al.
patent: 6374204 (2002-04-01), Mandell et al.
patent: 6493853 (2002-12-01), Savithri et al.
patent: 6578181 (2003-06-01), Hisada et al.
patent: 2003/0009733 (2003-01-01), Hathaway et al.
patent: 2005/0039152 (2005-02-01), Kidd et al.
patent: 10-21267 (1998-01-01), None

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