Electron microscope equipped with magnetic microprobe

Details Electron microscope equipped with magnetic microprobe Electron microscope equipped with magnetic microprobe

2007-07-10

2007-07-10

Kim, Robert (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Electron probe type

C250S311000, C250S306000, C250S307000, C250S550000, C250S492100, C250S492300, C369S126000, C073S105000

Reexamination Certificate

active

11134090

ABSTRACT:
There is disclosed an electron microscope equipped with a magnetic microprobe. The microscope can apply a strong electric field to a local area on a specimen made of a magnetic material. The magnetic flux density per unit area of the microprobe is high. The microscope includes a biprism for producing interference between an electron beam transmitted through the specimen and an electron beam passing through a vacuum. The specimen is held to a holder. The microprobe is made of a magnetic material and has a needle-like tip. The microscope further includes a moving mechanism capable of moving the microprobe toward and away from the specimen.

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Bunsen Y. Wong et al., “Direct Observation of Domain Walls in NiFe Films Using High-Resolution Lorentz Microscopy”,J. Appl. Phys., 79 (8), Apr. 15, 1996, pp. 6455-6457.
Marc De Graef et al., “In-situ Lorentz TEM Cooling Study of Magnetic Domain Configurations in Ni2MnGa”,IEEE Transactions on Magnetics, vol. 37, No. 4, Jul. 2001, pp. 2663-2665.

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