Electron microscope

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250441100, 250442100, G21K 508

Patent

active

050013505

ABSTRACT:
An electron microscope equipped with a specimen positioning device for moving specimen holders within a place perpendicular to the optical axis of the electron beam between the upper and lower magnetic pole pieces of the objective lens and bringing the holders onto the optical axis. The microscope has a member extending through the side wall of the yoke of the objective lens, a preliminary chamber connected with the side wall of the yoke via a valve, and an exchange mechanism. The member can mount and dismount the specimen holders. The plural holders are placed in position within the chamber. The exchange mechanism can mount and dismount the specimen holder placed at a certain position within the chamber and can move this holder between the magnetic pole pieces of the objective lens from the chamber to the member or vice versa. Once the inside of the lens is evacuated to a high vacuum, a plurality of specimens can be observed successively.

REFERENCES:
patent: 3679900 (1972-07-01), Kimura
patent: 3745341 (1973-07-01), Sakitani
patent: 3778621 (1973-12-01), Mikajiri
patent: 3896314 (1975-07-01), Nukui et al.
patent: 4020353 (1977-04-01), Saito et al.
patent: 4405865 (1983-09-01), Gentry et al.
patent: 4553069 (1985-11-01), Purser
patent: 4705950 (1987-11-01), Ohtaka
patent: 4710633 (1987-12-01), Suzuki
patent: 4771178 (1988-09-01), Egle et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electron microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron microscope will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2012096

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.