Electron microscope

Details Electron microscope Electron microscope

1988-01-05

1989-03-07

Anderson, Bruce C.

Radiant energy

Inspection of solids or liquids by charged particles

Electron microscope type

250397, H01J 3726, H01J 37244

Patent

active

048108863

ABSTRACT:
A transmission-type electron microscope using a sensitive two-dimensional sensor in its micrograph-taking section acts as a recording medium for an electron beam. When the sensor is illuminated with an electron beam, it stores the energy of the beam. When the sensor is subsequently illuminated with light, it releases the stored energy as light. In accordance with the invention, at least a portion of the micrograph-taking section includes a member for reducing the amount of x-rays produced or a member for absorbing x-rays to shield the sensor from x-rays.

REFERENCES:
patent: 3327112 (1967-06-01), Akahori
patent: 3671742 (1972-06-01), Browning

Affiliated with

Also associated with

Rating

Electron microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1670170