Electron microscope

Details Electron microscope Electron microscope

1976-08-09

1977-08-30

Church, Craig E.

Radiant energy

Inspection of solids or liquids by charged particles

Electron microscope type

250397, H01J 3726

Patent

active

040456692

ABSTRACT:
A condenses lens system condenses an elctron beam onto a specimen. The electron beam thus transmitted through the specimen is magnified by a magnifying lens system. The magnified electron beam is projected onto a fluorescent screen, and the image of the specimen is visually observed. The quantity of electrons per unit area in the magnified electron beam is detected by an electron beam detector. In response to the detected signal, the condenser lens system is controlled so as to make constant the quantity of electrons per unit area in the magnified electron beam.

REFERENCES:
patent: 3504176 (1970-03-01), Thon
patent: 3558885 (1971-01-01), Flemming
patent: 3937959 (1976-02-01), Namae

Affiliated with

Also associated with

Rating

Electron microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-963832