Electron beam sensitive positive resist comprising the polymeriz

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

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430296, 430942, 430326, 430311, 430331, 528 30, 528 32, G03C 1495, G03C 516

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046578412

ABSTRACT:
Poly(alkenyltrialkylsilane sulfone)s have been found to be electron beam sensitive and suitable for use as positive resists in a two layer resist system. The described resists are prepared by the polymerization of an .omega.-alkenyltrimethylsilane with sulfur dioxide with or without a second solubilizing olefinic compound. The resultant composition evidences high sensitivity, excellent resolution characteristics and excellent resistance to oxygen reactive-ion etching.

REFERENCES:
patent: 3223686 (1965-12-01), Natta et al.
patent: 3893127 (1975-07-01), Kaplan et al.
patent: 3898350 (1975-08-01), Gipstein et al.
patent: 4396702 (1983-08-01), Desai et al.
Julius Grant, ed, Hackh's Chemical Dictionary [American and British Usage], Third Edition, McGraw-Hill Book Company, Inc., New York, N.Y., 1944, p. 17.

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