Image analysis – Image transformation or preprocessing – Measuring image properties
Patent
1998-01-16
2000-05-02
Couso, Yon J.
Image analysis
Image transformation or preprocessing
Measuring image properties
348191, G06K 936
Patent
active
060582219
ABSTRACT:
In a method of measuring electron beam profile in an electronic display device, a matrix of video dots is displayed on a display screen of the electronic display device, each of the video dots being comprised of a group of phosphor dots illuminated by an electron beam. An image of a plurality of groups of illuminated phosphor dots forming the video dots within a field of view is then taken. The average horizontal and vertical distances of the video dots within the filed of view is determined and the groups of illuminated phosphor dots forming the video dots in the field of view that are captured in the image are superimposed based on the average horizontal and vertical distances of the video dots generally to average and fill in discontinuities between phosphor dots in the groups and thereby generate an overlay image of the electron beam. Cross-sections of the overlay image can be approximated and at least one intensity profile of the electron beam calculated. Overlay images of each color electron beam can also be captured simultaneously and a convergence error calculated.
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Bukal Branko
Nemeth Karoly G.
Safaee-Rad Reza
Couso Yon J.
Image Processing Systems Inc.
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