4. Image analysis
  5. Image transformation or preprocessing
  6. Measuring image properties

Branko Bukal

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Electron beam profile measurement method and system

Image analysis – Image transformation or preprocessing – Measuring image properties
Patent

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Method and apparatus for optical inspection of a display

Image analysis – Image transformation or preprocessing – Changing the image coordinates
Reexamination Certificate

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Test and alignment system for electronic display devices

Television – Monitoring – testing – or measuring – Testing of image reproducer
Reexamination Certificate

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Test and alignment system for electronic display devices and tes

Television – Monitoring – testing – or measuring – Testing of image reproducer
Patent

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Profile ID: LFUS-PAI-P-1564609

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