Electron beam microfabrication apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports

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250492A, G21K 506

Patent

active

041031687

ABSTRACT:
Electron microscope apparatus for electron beam microfabrication. A mounting is described for supporting at least the final lens assembly of an electron microscope column above the vacuum chamber which also provides a rigid mounting for a stage on which a substrate is located together with reflecting mirrors which co-operate with a laser interferometer system for measuring the distances moved by the stage and therefore the substrate in two orthogonal directions.
To avoid unwanted movement between the mirrors and the interferometer heads, the latter are also carried by rigid support means on the underside of the mounting.
The mounting may comprise a solid ring located in an aperture in the lid of the vacuum chamber.
Alternatively, the mounting may comprise a rigid and reinforced plate forming the lid of the chamber, from the underside of which extend the rigid support means for the stage and interferometer heads. The laser is mounted on a rigid extension of the mounting overhanging the chamber so that alignment is always maintained between all parts of the laser interferometer system.

REFERENCES:
patent: 3648048 (1972-03-01), Cahan et al.
patent: 3887811 (1975-06-01), Livesay
patent: 3900737 (1975-08-01), Collier et al.

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