Electron beam apparatus for testing infrared detectors in a cryo

Details Electron beam apparatus for testing infrared detectors in a cryo Electron beam apparatus for testing infrared detectors in a cryo

1988-12-08

1990-05-29

Berman, Jack I.

Radiant energy

Inspection of solids or liquids by charged particles

Methods

250310, 2502521, H01J 37252

Patent

active

049298313

ABSTRACT:
An apparatus for testing infrared detectors in response to a selectively controlled electron beam within a cryogenically shielded environment includes a cryostat having an aperture which is positioned adjacent to a scanning electron microscope. An electron beam emitted from the microscope propagates through the aperture to illuminate an infrared detector mounted within the cryostat so that the detector can be tested in an environment substantially free of spurious infrared radiation.

REFERENCES:
patent: 3939347 (1976-02-01), Shifrin
patent: 4645931 (1987-02-01), Gordon et al.
Flesner et al., "Electron-Beam Apparatus for Testing LWIR Detectors in a ogenically Shielded Environment", IEEE Trans. Nucl. Sci., V NS-34, 6 Dec. 1987, pp. 1602-1605.

Affiliated with

Also associated with

Rating

Electron beam apparatus for testing infrared detectors in a cryo does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electron beam apparatus for testing infrared detectors in a cryo, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electron beam apparatus for testing infrared detectors in a cryo will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-522753