Electron beam apparatus and method of manufacturing...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

Reexamination Certificate

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C250S306000, C250S307000

Reexamination Certificate

active

07745784

ABSTRACT:
The present invention provides an electron beam apparatus for evaluating a sample surface, which has a primary electro-optical system for irradiating a sample with a primary electron beam, a detecting system, and a secondary electro-optical system for directing secondary electron beams emitted from the sample surface by the irradiation of the primary electron beam to the detecting system.

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Japanese Office Action dated Jul. 22, 2008 issued in corresponding Japanese Patent Application No. 2007-000925.

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