Electroless copper plating method for forming integrated circuit

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438687, H01L 2144

Patent

active

058011005

ABSTRACT:
A method for fabricating a copper containing integrated circuit structure within an integrated circuit, and the copper containing integrated circuit structure formed through the method. There is first provided a substrate layer. There is then formed through a first electroless plating method a nickel containing conductor layer over the substrate layer. There is then activated the nickel containing conductor layer to form an activated nickel surface of the nickel containing conductor layer. Finally, there is then formed through a second electroless plating method a copper containing conductor layer upon the nickel containing conductor layer. Optionally, there may be formed a polysilicon layer over the substrate prior to forming the nickel containing conductor layer over the substrate, where the nickel containing conductor layer is formed upon the polysilicon layer. Optionally, there may also be formed a second nickel containing conductor layer upon the copper containing conductor layer. The method is useful in forming copper containing integrated circuit inductor structures within integrated circuits.

REFERENCES:
patent: 4122215 (1978-10-01), Vratny
patent: 4265943 (1981-05-01), Goldstein et al.
patent: 4661375 (1987-04-01), Thomas
patent: 5334346 (1994-08-01), Kim et al.
patent: 5358907 (1994-10-01), Wong
patent: 5384284 (1995-01-01), Doan et al.
patent: 5431959 (1995-07-01), Kologe
Quirke et al. "Planar Magnetic Component Technology--A Review"IEEE Trans. on Components, Hybrids+Manufacturing Technology, vol. 15(5). Oct. 1992, pp. 884-892.
Yamaguchi et al. "Characteristics and Analysis of a Thin Film Inductor with Closed Magnetic Circuit Structure" IEEE Trans on Magnetics, vol. 28(5), Sep. 1992, pp. 3015-3017.
Ahn et al. "A Fully Integrated Planar Torroidal Inductor with a Micromachined Nikel-Iron Magnetic Bar" IEEE Trans on Components, Packaging and Manufacturing Technology Part A, vol. 17(3) Sep. 1994, pp. 463-469.
Ashby et al "High Q Inductors for Wireless Applications In a Complementary Silicon Bipolar Process" IEEE J. of Solid State Circuits, vol. 31(1), Jan. 1996, pp. 4-9.
McBrayer et al. "Diffusion of Metals in Silicon Dioxide" J. Electrochem Soc. vol. 133(6), Jun. 1986, pp. 1242-1246.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electroless copper plating method for forming integrated circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electroless copper plating method for forming integrated circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electroless copper plating method for forming integrated circuit will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-269929

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.