Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-03-18
2000-01-04
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324752, G01R 3100
Patent
active
060114029
ABSTRACT:
Two-dimensional electric-filed vector is measured in this invention, wherein two linearly polarized laser beams are focused on two different bottom planes of an electro-optic crystal so that two reflected beams from the bottom planes have two different paths inside the electro-optic crystal and thus have different phase retardation when an electric-field is exerted on the electro-optic crystal by a circuit under test. The electric-filed direction of the circuit can be calculated by using two differential signals which are proportional to the phase retardation of the two reflected beams.
REFERENCES:
patent: 5113131 (1992-05-01), Cooper et al.
patent: 5546011 (1996-08-01), Takahashi et al.
patent: 5883518 (1999-03-01), Borden
Takahashi et al., "Sampling and Real-Time Methods in Electro-Optic Probing System", IEEE Transactions on Instrumentation and Measurement 44:965-971, Oct. 1995.
Chang Liang-Chih
Chen Wen-Fa
Chou Hsiao-Yu
Chung Ping-Chung
Huang Sheng-Lung
Ballato Josie
National Science Council
Tang Minh
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